DocumentCode :
1190217
Title :
On the topological testability conjecture for analog fault diagnosis problems
Author :
Togawa, Yoshio ; Matsumoto, Takashi
Volume :
31
Issue :
2
fYear :
1984
fDate :
2/1/1984 12:00:00 AM
Firstpage :
147
Lastpage :
158
Abstract :
This paper gives a proof of a sharpened version of the conjecture in [1]. Let \\bf{C}^{r} be r -dimensional complex vector space and let g \\in {\\bf C}^{r} be the vector of branch admittances of an analog network. A subset of {\\bf C}^{r} is said to be ample if (i) its complement has Lebesgue measure zero, (ii) it is open, and (iii) it is dense. The sharpened version of the conjecture claims that the k -node fault testability condition [1] is satisfied on an ample subset of values of g , if, and only if, for any set X of inaccessible nodes, there are at least k + 1 nodes in X^{C} (complement of X ) each of which is connected with X via a branch. This is extremely powerful because the result depends only on the topology of a network and the condition can be checked by inspection. The proof justifies the fault location method developed in [1].
Keywords :
Analog system fault diagnosis; Circuit topology; Fault diagnosis; Admittance; Circuit faults; Equations; Fault diagnosis; Fault location; Information science; Inspection; Network topology; Testing; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1984.1085478
Filename :
1085478
Link To Document :
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