• DocumentCode
    1190217
  • Title

    On the topological testability conjecture for analog fault diagnosis problems

  • Author

    Togawa, Yoshio ; Matsumoto, Takashi

  • Volume
    31
  • Issue
    2
  • fYear
    1984
  • fDate
    2/1/1984 12:00:00 AM
  • Firstpage
    147
  • Lastpage
    158
  • Abstract
    This paper gives a proof of a sharpened version of the conjecture in [1]. Let \\bf{C}^{r} be r -dimensional complex vector space and let g \\in {\\bf C}^{r} be the vector of branch admittances of an analog network. A subset of {\\bf C}^{r} is said to be ample if (i) its complement has Lebesgue measure zero, (ii) it is open, and (iii) it is dense. The sharpened version of the conjecture claims that the k -node fault testability condition [1] is satisfied on an ample subset of values of g , if, and only if, for any set X of inaccessible nodes, there are at least k + 1 nodes in X^{C} (complement of X ) each of which is connected with X via a branch. This is extremely powerful because the result depends only on the topology of a network and the condition can be checked by inspection. The proof justifies the fault location method developed in [1].
  • Keywords
    Analog system fault diagnosis; Circuit topology; Fault diagnosis; Admittance; Circuit faults; Equations; Fault diagnosis; Fault location; Information science; Inspection; Network topology; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1984.1085478
  • Filename
    1085478