Title :
High-frequency photodiode characterization using a filtered intensity noise technique
Author :
Baney, D.M. ; Sorin, W.V. ; Newton, S.A.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Abstract :
Optical filtering of amplified spontaneous emission improves measurement dynamic range for frequency response measurements of optoelectronic receivers. For high bandwidth receivers, a novel periodically filtered intensity noise technique is proposed. Response measurements using these techniques on a 1 GHz and 30 GHz receiver are demonstrated.<>
Keywords :
frequency response; noise measurement; optical filters; optical receivers; photodiodes; semiconductor device testing; superradiance; 1 GHz; 30 GHz; HF photodiode characterization; amplified spontaneous emission; filtered intensity noise technique; frequency response measurements; high bandwidth receivers; high-frequency characterization; measurement dynamic range; optical filtering; optoelectronic receivers; periodic filtering; Dynamic range; Filtering; Frequency measurement; Frequency response; Optical filters; Optical noise; Optical receivers; Photodiodes; Spontaneous emission; Stimulated emission;
Journal_Title :
Photonics Technology Letters, IEEE
