DocumentCode :
1190802
Title :
CPP-GMR with oxidized CoFe layer on various lower-electrode materials
Author :
Hoshino, Katsumi ; Hoshiya, Hiroyuki ; Katada, Hiroyuki ; Yoshida, Nobuo ; Watanabe, Katsuro ; Nakamoto, Kazuhiro
Author_Institution :
Storage Technol. Res. Center, Hitachi, Ltd, Kanagawa, Japan
Volume :
41
Issue :
10
fYear :
2005
Firstpage :
2926
Lastpage :
2928
Abstract :
We investigated current perpendicular to the plane-giant magnetoresistive (CPP-GMR) films with a current screen layer of oxidized CoFe. The magnetoresistance (MR) ratio increased monotonically with an increment of resistance-area product (RA) when the thickness of the precursor CoFe layer was increased. We were able to obtain a high MR ratio of 6.7% at an RA of about 2 Ωμm2. Based on transmission electron microscopic observations, the current screen layer was crystalline, and some metal portions were locally observed in the current screen layer. We also investigated the dependence of CPP-GMR properties on he crystalline structure by changing lower-electrode materials. Decreasing RA without a degradation of MR ratio was observed with increasing grain sizes by changing the lower-electrode materials. Fabricated read heads for perpendicular recording, which had a track-width of 80 nm with an MR ratio of 3% and an RA of 0.6 Ωμm2, showed a high output voltage of 2.2 mV and a good head-amp signal-to-noise ratio of 30 dB, at an operating voltage of 120 mV. Therefore, an improved CPP-GMR film up to a high MR ratio of 6% at the low RA of 0.3 Ωμm2 with good soft magnetic properties is promising for future read heads of over 200 Gb/in2.
Keywords :
cobalt compounds; crystal structure; giant magnetoresistance; magnetic thin films; perpendicular magnetic recording; soft magnetic materials; transmission electron microscopy; CPP-GMR film; CoFe; MR ratio; crystalline structure; current perpendicular to the plane-giant magnetoresistive film; current screen layer; grain size; lower-electrode material; magnetoresistance ratio; perpendicular recording; read-head performance; resistance-area; soft magnetic property; transmission electron microscopy; Crystalline materials; Crystallization; Degradation; Grain size; Magnetic heads; Magnetic materials; Magnetoresistance; Perpendicular magnetic recording; Transmission electron microscopy; Voltage; CPP-GMR; current screen layer; grain size; read-head performance;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2005.855313
Filename :
1519163
Link To Document :
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