Title :
A study of noise effects due to the diode protection for shield resistance measurement of GMR recording heads
Author :
Siritaratiwat, A. ; Tongsomporn, D. ; Chooruang, K. ; Afzulpurkar, N.
Author_Institution :
Dept. of Electr. Eng., Khon Kaen Univ., Thailand
Abstract :
This paper examines the noise effects of protection diodes used for preventing voltage breakdown during magnetoresistive (MR)-shield resistance measurement in quasi-static test (QST) for giant magnetoresistive heads (GMR). Two forms of diode protection will be presented and the noise behavior of them will be discussed and compared in the context of the GMR Noise test.
Keywords :
diodes; giant magnetoresistance; magnetic heads; magnetic recording noise; magnetoresistive devices; GMR recording heads; diode protection; giant magnetoresistive heads; magnetoresistive-shield resistance measurement; quasistatic test; voltage breakdown prevention; Circuit noise; Circuit testing; Electrical resistance measurement; Giant magnetoresistance; Magnetic heads; Magnetic noise; Noise level; Probes; Protection; Schottky diodes; Diode protection; magnetic noise; magnetoresistive (MR)-shield;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.855324
