DocumentCode :
1190902
Title :
R68-22 Current Status of Large Scale Integration Technology
Author :
Murrell, T.A.
Issue :
5
fYear :
1968
fDate :
5/1/1968 12:00:00 AM
Firstpage :
521
Lastpage :
522
Abstract :
This paper combines a useful review of progress during the past year, a description of present programs and immediate goals, and some forecasts of ultimate goals. Although the author, as director of Texas Instruments´ semiconductor research and development laboratories, deals primarily with programs and points of view at TI, he makes enough references to work at other companies to build up a reasonably comprehensive picture of the large-scale integration field. Four main areas are covered: bipolar chip technology, full-slice technology, MOS technology, and hybrid technology.
Keywords :
Circuit faults; Integrated circuit technology; Large scale integration; Logic arrays; Logic gates; Metallization; Programmable logic arrays; Redundancy; Shift registers; Wiring;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1968.226917
Filename :
1687387
Link To Document :
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