• DocumentCode
    1191029
  • Title

    Method of Calculating the Charge Acceptance of Organic Photoconductors

  • Author

    Jahn, Helmut

  • Author_Institution
    Kalle Hoechst Aktiengesellschaft, D6230 Frankfurt 80, Germany.
  • Issue
    4
  • fYear
    1978
  • fDate
    7/1/1978 12:00:00 AM
  • Firstpage
    369
  • Lastpage
    372
  • Abstract
    The charge acceptance of organic photoconductors (OPC) consisting of thin layers must attain the correct value in order to produce constant copy quality. In practice, however, it can be kept constant only by taking elaborate precautions, since a number of parameters have an adverse effect on charge acceptance. The limits are described within which the photoconductors and corona properties fluctuate in actual running machines. The properties of the photo-conductor can scarcely be influenced by the user, but proper choice of the electric parameters of the charging scorotron can largely suppress the influence of the fluctuations on the final charge of the photo-conductor. If the charging device exhibits the behavior of an ideal constant voltage supply characteristic, charge acceptance would depend solely on the tolerances of this device. If the charging device supplies constant current, charge acceptance depends primarily on the properties of the photoconductor. A careful estimate must be made to determine, under conditions as practical as possible, reasons for variations in charge acceptance. There are those caused by fluctuations in the charging device and those caused by fluctuations in the photoconductor. A mathematical method is described which makes it relatively simple to determine the actual OPC charge acceptance depending on application and variation of the electrical parameters.
  • Keywords
    Capacitance; Corona; Current supplies; Dark current; Fluctuations; Industry Applications Society; Photoconducting devices; Photoconductivity; Solids; Voltage;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.1978.4503553
  • Filename
    4503553