DocumentCode :
1191210
Title :
Dual Layer X-ray photoelectron spectroscopy model to simultaneously determine a PFPE/A20H lubricant mixture and carbon-Layer thicknesses on hard-disk magnetic media
Author :
Spaulding, David ; Yang, Zunde ; Liu, Jia Jay
Author_Institution :
MMC Technol., San Jose, CA, USA
Volume :
41
Issue :
10
fYear :
2005
Firstpage :
3040
Lastpage :
3042
Abstract :
New blends of complex lubricants have recently been introduced to help meet the increasing tribological demands being placed on the head-disk interface in hard-disk drives. A20H (Moresco), a hybrid molecule consisting of a perfluoropolyether (PFPE) lubricant (Z-Dol) and cyclic phosphazene (X1P), is one such lubricant used in combination with a simple PFPE (e.g., Z-Dol). This paper describes an X-ray photoelectron spectroscopy (XPS) method to simultaneously measure the thickness of each lubricant component, as well as the carbon layer thickness, via reference to the magnetic layer.
Keywords :
X-ray photoelectron spectra; carbon; hard discs; lubricants; magnetic heads; magnetic multilayers; A20H carbon; ESCA; PFPE/A20H lubricant mixture; X-ray photoelectron spectroscopy; XPS; carbon layer thickness; cyclic phosphazene; hard-disk drive; hard-disk magnetic media; head-disk interface; magnetic layer; moresco; perfluoropolyether lubricant; Attenuation; Equations; Hard disks; Hydrocarbons; Lubricants; Measurement standards; Spectroscopy; Spine; Thickness measurement; Writing; A20H carbon; ESCA; X-ray photoelectron spectroscopy (XPS); lubricant; moresco; thickness;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2005.855262
Filename :
1519200
Link To Document :
بازگشت