• DocumentCode
    1191325
  • Title

    AlGaAs/GaAs double-heterostructure-emitter bipolar transistor (DHEBT)

  • Author

    Liu, Wen-Chau ; Guo, Der-Feng ; Lour, Wen-Shiung

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
  • Volume
    39
  • Issue
    12
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    2740
  • Lastpage
    2744
  • Abstract
    An AlGaAs/GaAs double-heterostructure-emitter bipolar transistor (DHEBT) fabricated by molecular beam epitaxy (MBE) is presented. The use of a structure symmetrical with respect to the base layer results in bidirectional transistor and switching behavior. Due to a significant area difference between emitter-base and base-collector junction, an asymmetrical property is observed. With an emitter edge-thinning design, the transistor performance may be further improved. A common-emitter current gain of up to 140 with a negligible collector-emitter offset voltage (~40 mV) is achieved. A bidirectional S-shaped negative-differential-resistance (NDA) phenomenon occurs at high V CE bias voltage. The temperature dependence of the NDR is investigated. A three-terminal-controlled switching device is found to perform well when the control current is introduced into the base electrode
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; molecular beam epitaxial growth; negative resistance; AlGaAs-GaAs; DHEBT; MBE; asymmetrical property; base electrode; bidirectional S-shaped NDR; bidirectional switching behaviour; bipolar transistor; common-emitter current gain; control current; double-heterostructure-emitter; emitter edge-thinning design; molecular beam epitaxy; negative-differential-resistance; temperature dependence; three-terminal-controlled switching device; Associate members; Bipolar transistors; DH-HEMTs; Electrodes; Etching; Gallium arsenide; Molecular beam epitaxial growth; Switching circuits; Temperature dependence; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.168743
  • Filename
    168743