Title :
Fabrication and characterization of compositionally graded PbXSr1−xTiO3 thin films on stainless steel by the sol-gel method
Author :
Shengli Huang ; Jianguo Chen ; Jinrong Cheng
Author_Institution :
Sch. of Mater. Sci. & Eng., Shanghai Univ., Shanghai, China
Abstract :
Different compositionally graded PbXSr1-xTiO3 (x=0.2, 0.3, 0.4, 0.5 and 0.6) (PST) thin films were deposited on LaNiO3(LNO)-buffered stainless steel (SS) substrates. Both LNO and PST thin films were prepared by the sol-gel method. X-ray diffraction and scanning electron microscopy analysis were used to investigate the crystallinity and surface morphology of PST thin films. It showed that the crack-free PST thin films presented pure perovskite phase. The temperature and frequency stability of tunability has been improved. The change rate of tunability could be less than 5% in a wide range of temperature.
Keywords :
X-ray diffraction; ferroelectric ceramics; ferroelectric thin films; ferroelectricity; lead compounds; scanning electron microscopy; sol-gel processing; strontium compounds; surface morphology; PbXSr1-xTiO3; X-ray diffraction; buffered stainless steel; compositionally graded thin films; crack-free thin films; crystallinity; frequency stability; perovskite phase; scanning electron microscopy analysis; sol-gel method; surface morphology; temperature stability; tunability change rate; Dielectric constant; Films; Substrates; Temperature distribution; Temperature measurement; PST thin films; Sol-gel method; Stable tunability; Stainless Steel;
Conference_Titel :
Applications of Ferroelectrics, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy (ISAF/IWATMD/PFM), 2014 Joint IEEE International Symposium on the
Conference_Location :
State College, PA
DOI :
10.1109/ISAF.2014.6922980
