DocumentCode :
1191550
Title :
Effect of High-Temperature Processing on the Aging Behavior of Precision 5-MHz Quartz Crystal Units
Author :
Byrne, R.J. ; Hokanson, J.L.
Volume :
17
Issue :
1
fYear :
1968
fDate :
3/1/1968 12:00:00 AM
Firstpage :
76
Lastpage :
79
Abstract :
The influence of contamination level on the aging behavior of quartz crystal resonators has been studied. Resonators were made using high-temperature bonding techniques and were baked prior to sealing in both dry hydrogen and under high vacuum in order to minimize the level of contamination within the enclosure. The initial stabilization period for the frequency drift rate to reach 3 parts per 1010/month and the period to restabilize after power interruption to oven and oscillator is usually less than a week for these units. The time periods to reach the same drift rate for units made using the current state-of-the-art fabrication tecnhiques range from one to six months. The difference in aging behavior is discussed in terms of a possible aging mechanism.
Keywords :
Aging; Bonding; Contamination; Electrodes; Glass; Hydrogen; Oscillators; Resonant frequency; Stability; Vibration control;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1968.4313667
Filename :
4313667
Link To Document :
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