• DocumentCode
    1191570
  • Title

    Effects of CoZrNb surface morphology on magnetic properties and grain isolation of CoCrPtO perpendicular recording media

  • Author

    Hong, Dae Hoon ; Park, Sang Hwan ; Lee, Taek Dong

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Korea Adv. Energy Res. Inst., Daejeon, South Korea
  • Volume
    41
  • Issue
    10
  • fYear
    2005
  • Firstpage
    3148
  • Lastpage
    3150
  • Abstract
    In this paper, the sputtering pressure of the soft magnetic underlayers(SUL) was varied to study effects of SUL conditions such as surface morphology and residual stress on magnetic properties of the recording layers. As the sputtering pressure of the SUL increases, the coercivity (Hc) increases drastically up to 10 mtorr and decreases gradually beyond the pressure. TEM images reveal that the several grains of the CoCrPtO layer form a cluster and the cluster is surrounded by the thick oxides. The increased Hc is attributed to the reduction of exchange coupling among the clusters by making isolation through the thick oxide boundaries. The behavior of Hc variation with the sputtering pressure of the SULs is in good agreement with that of residual stress induced on the SUL. This is because the surface mophology is affected by the residual stress, and the grain isolation is very dependent on the surface topology of the SUL. However, the direct relationship between surface topology and residual stress is still not clearly known.
  • Keywords
    chromium compounds; cobalt compounds; coercive force; grain boundaries; internal stresses; perpendicular magnetic recording; platinum compounds; soft magnetic materials; sputtering; surface morphology; transmission electron microscopy; CoCrPtO; CoZrNb; CoZrNb surface morphology; SUL condition; TEM image; exchange coupling; grain isolation; magnetic property; perpendicular recording media; recording layer; residual stress; soft magnetic underlayer; sputtering pressure; thick oxide boundary; Amorphous magnetic materials; Magnetic hysteresis; Magnetic properties; Magnetic recording; Materials science and technology; Perpendicular magnetic recording; Residual stresses; Soft magnetic materials; Sputtering; Surface morphology; CoCrPtO; perpendicular recording; residual stress; soft magnetic underlayer; surface morphology;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2005.855274
  • Filename
    1519236