• DocumentCode
    1191580
  • Title

    Effect of interface roughness on exchange coupling in synthetic antiferromagnetic multilayers

  • Author

    Desai, M. ; Misra, A. ; Doyle, W.D.

  • Author_Institution
    Center for Mater. for Inf. Technol., Alabama Univ., Tuscaloosa, AL, USA
  • Volume
    41
  • Issue
    10
  • fYear
    2005
  • Firstpage
    3151
  • Lastpage
    3153
  • Abstract
    FeCo/Ru/FeCo synthetic antiferromagnetic (SAF) multilayers with different FeCo/Ru interface roughnesses were prepared by varying the sputtering conditions. The films were characterized by hysteresis loops and torque magnetometry. A large remanence observed in the hard direction for the SAF with interface root-mean-square (RMS) roughness of 0.83 nm suggested a large biquadratic exchange coupling, while the SAF with RMS interface roughness of 0.49 showed primarily bilinear behavior. From field dependent torque curves, assuming coherent rotation, the values of J1 and J2 were found to be 0.35 and 0.05 erg/cm2, respectively, in the smooth SAF compared to 0.13 and 0.16 erg/cm2 in the rough SAF. The results are in reasonable agreement with the values obtained from the hysteresis loops and are consistent with the model for apparent biquadratic exchange arising from ferromagnetic coupling through pinholes in the Ru spacer layer.
  • Keywords
    antiferromagnetic materials; exchange interactions (electron); interface roughness; iron alloys; magnetic hysteresis; magnetic multilayers; magnetic thin films; perpendicular magnetic recording; remanence; 0.49 nm; 0.83 nm; FeCo-Ru-FeCo; SAF multilayer; biquadratic exchange coupling; ferromagnetic coupling; field dependent torque curves; hysteresis loop; interface roughness; perpendicular recording media; root-mean-square roughness; soft underlayer; sputtering condition; synthetic antiferromagnetic multilayers; torque magnetometry; Antiferromagnetic materials; Magnetic field measurement; Magnetic hysteresis; Magnetic multilayers; Magnetic separation; Nonhomogeneous media; Perpendicular magnetic recording; Sputtering; Torque; USA Councils; Bilinear; biquadratic coupling; interface roughness; perpendicular recording media; soft underlayer; synthetic antiferromagnetic (SAF); torque;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2005.855272
  • Filename
    1519237