DocumentCode
1191580
Title
Effect of interface roughness on exchange coupling in synthetic antiferromagnetic multilayers
Author
Desai, M. ; Misra, A. ; Doyle, W.D.
Author_Institution
Center for Mater. for Inf. Technol., Alabama Univ., Tuscaloosa, AL, USA
Volume
41
Issue
10
fYear
2005
Firstpage
3151
Lastpage
3153
Abstract
FeCo/Ru/FeCo synthetic antiferromagnetic (SAF) multilayers with different FeCo/Ru interface roughnesses were prepared by varying the sputtering conditions. The films were characterized by hysteresis loops and torque magnetometry. A large remanence observed in the hard direction for the SAF with interface root-mean-square (RMS) roughness of 0.83 nm suggested a large biquadratic exchange coupling, while the SAF with RMS interface roughness of 0.49 showed primarily bilinear behavior. From field dependent torque curves, assuming coherent rotation, the values of J1 and J2 were found to be 0.35 and 0.05 erg/cm2, respectively, in the smooth SAF compared to 0.13 and 0.16 erg/cm2 in the rough SAF. The results are in reasonable agreement with the values obtained from the hysteresis loops and are consistent with the model for apparent biquadratic exchange arising from ferromagnetic coupling through pinholes in the Ru spacer layer.
Keywords
antiferromagnetic materials; exchange interactions (electron); interface roughness; iron alloys; magnetic hysteresis; magnetic multilayers; magnetic thin films; perpendicular magnetic recording; remanence; 0.49 nm; 0.83 nm; FeCo-Ru-FeCo; SAF multilayer; biquadratic exchange coupling; ferromagnetic coupling; field dependent torque curves; hysteresis loop; interface roughness; perpendicular recording media; root-mean-square roughness; soft underlayer; sputtering condition; synthetic antiferromagnetic multilayers; torque magnetometry; Antiferromagnetic materials; Magnetic field measurement; Magnetic hysteresis; Magnetic multilayers; Magnetic separation; Nonhomogeneous media; Perpendicular magnetic recording; Sputtering; Torque; USA Councils; Bilinear; biquadratic coupling; interface roughness; perpendicular recording media; soft underlayer; synthetic antiferromagnetic (SAF); torque;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2005.855272
Filename
1519237
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