Title :
Microstructure improvement of thin Ru underlayer for CoCrPt-SiO2 granular perpendicular media
Author :
Mukai, Ryoichi ; Uzumaki, Takuya ; Tanaka, Atsushi
Author_Institution :
Storage Syst. Labs., Fujitsu Labs. Ltd., Kanagawa, Japan
Abstract :
We improved the microstructure of a thin Ru underlayer for CoCrPt-SiO2 granular-type dual-layer perpendicular media. The microstructure improvement was achieved by development of a stacked structure. In this paper, we studied the relationship between the c-axis distribution ΔΘ50 of the Ru underlayer and the recording performances of media. We found that the signal-to-media-noise ratio (SNR) of media increased with decreasing the ΔΘ50 of the Ru underlayer when the recording layer with same segregated fine-grain structure was prepared. The SNR for shielded pole head at 480kfci increased significantly from 12.8 to 17.2 dB when decreasing the ΔΘ50 from 4.9° to 3.2°.
Keywords :
cobalt alloys; granular materials; magnetic heads; magnetic particles; magnetic recording noise; perpendicular magnetic recording; ruthenium; silicon alloys; 12.8 to 17.2 dB; CoCrPt-SiO2; Ru; SNR; dual-layer perpendicular media; fine-grain structure; granular perpendicular media; low c-axis distribution; microstructure improvement; recording layer; recording performance; shielded pole head; signal-to-media-noise ratio; stacked structure; thin Ru underlayer; Grain boundaries; Helium; Laboratories; Magnetic heads; Magnetic recording; Magnetic separation; Microstructure; Position control; Signal to noise ratio; Sputtering; CoCrPt–SiO; dual-layer perpendicular media; low; microstructure improvement of Ru underlayer; signal-to-noise ratio (SNR) improvement; stacked Ru underlayer; thin Ru underlayer;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.855279
