The thermal treatment effect on electrical properties of mn-modified polycrystalline BiFeO3 thin films

Author

Sangwook Kim ; Won-Jeong Kim ; Myang Hwan Lee ; Jin Su Park ; Da Jeong Kim ; Myong-Ho Kim ; Tae Kwon Song ; Dalhyun Do

Author_Institution

Dept. of Phys., Changwon Nat. Univ., Changwon, South Korea

fYear

2014

fDate

12-16 May 2014

Firstpage

1

Lastpage

4

Abstract

Mn modified BFO (BFMO) thin films has been deposited using pulsed laser deposition on Pt(111)/Ti/SiO₂/Si(100) substrates at 540°C. After completion of deposition, the BFMO thin films were cooled by two different procedures; quenching and chamber cooling. Differences in structural and electrical properties of BFMO thin films were investigated by an X-ray diffractometer and an electrical system, respectively. Improvement in ferroelectricity, a large remnant polarization of ~187.39 μC/cm² with 600 kV/cm, was found from the quenched BFMO film. This was attributed to the observed high texturing along (111) orientation. Reduced leakage current density of the quenched BFMO films were explained by defect chemistry with a possibly lower concentration of the oxygen vacancy due to quenching procedure.

Keywords

X-ray diffraction; bismuth compounds; dielectric polarisation; doping; impurity-vacancy interactions; manganese; multiferroics; pulsed laser deposition; quenching (thermal); texture; (111) orientation texturing; BiFeO₃:Mn; Pt(111)-Ti-SiO₂-Si(100) substrate; Pt-Ti-SiO₂-Si; X-ray diffraction; chamber cooling; electrical properties; ferroelectricity; leakage current density; oxygen vacancy; polycrystalline thin films; pulsed laser deposition; quenching; remnant polarization; structural properties; temperature 540 degC; thermal treatment effect; Bismuth; Cooling; Epitaxial growth; Leakage currents; Pulsed laser deposition; Substrates; Mn modified BFO thin film; Pulsed laser deposition; secaning Quenching process;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy (ISAF/IWATMD/PFM), 2014 Joint IEEE International Symposium on the

Conference_Location

State College, PA

Type

conf

DOI

10.1109/ISAF.2014.6922986

Filename

6922986