Title :
The thermal treatment effect on electrical properties of mn-modified polycrystalline BiFeO3 thin films
Author :
Sangwook Kim ; Won-Jeong Kim ; Myang Hwan Lee ; Jin Su Park ; Da Jeong Kim ; Myong-Ho Kim ; Tae Kwon Song ; Dalhyun Do
Author_Institution :
Dept. of Phys., Changwon Nat. Univ., Changwon, South Korea
Abstract :
Mn modified BFO (BFMO) thin films has been deposited using pulsed laser deposition on Pt(111)/Ti/SiO2/Si(100) substrates at 540°C. After completion of deposition, the BFMO thin films were cooled by two different procedures; quenching and chamber cooling. Differences in structural and electrical properties of BFMO thin films were investigated by an X-ray diffractometer and an electrical system, respectively. Improvement in ferroelectricity, a large remnant polarization of ~187.39 μC/cm2 with 600 kV/cm, was found from the quenched BFMO film. This was attributed to the observed high texturing along (111) orientation. Reduced leakage current density of the quenched BFMO films were explained by defect chemistry with a possibly lower concentration of the oxygen vacancy due to quenching procedure.
Keywords :
X-ray diffraction; bismuth compounds; dielectric polarisation; doping; impurity-vacancy interactions; manganese; multiferroics; pulsed laser deposition; quenching (thermal); texture; (111) orientation texturing; BiFeO3:Mn; Pt(111)-Ti-SiO2-Si(100) substrate; Pt-Ti-SiO2-Si; X-ray diffraction; chamber cooling; electrical properties; ferroelectricity; leakage current density; oxygen vacancy; polycrystalline thin films; pulsed laser deposition; quenching; remnant polarization; structural properties; temperature 540 degC; thermal treatment effect; Bismuth; Cooling; Epitaxial growth; Leakage currents; Pulsed laser deposition; Substrates; Mn modified BFO thin film; Pulsed laser deposition; secaning Quenching process;
Conference_Titel :
Applications of Ferroelectrics, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy (ISAF/IWATMD/PFM), 2014 Joint IEEE International Symposium on the
Conference_Location :
State College, PA
DOI :
10.1109/ISAF.2014.6922986
