Title :
Growth of Ca3Ta(Ga0.5Al0.5)3Si2O14 piezoelectric single crystal and the piezoelectric properties
Author :
Kudo, Takahiro ; Shoji, Yozo ; Ohashi, Yoshimasa ; Medvedev, Alexander ; Kurosawa, Shunsuke ; Yoshikawa, Akira ; Yokota, Yuji ; Kamada, K.
Author_Institution :
Inst. for Mater. Res., Tohoku Univ., Sendai, Japan
Abstract :
We grew Ca3Ta(Ga0.5Al0.5)3Si2O14 piezoelectric single crystal with a diameter of 1 inch by Czochralski method and the physical properties were investigated. The grown crystal indicated high transparency with the yellow color. In addition, there was no crack in the crystal. By the powder X-ray diffraction measurement, the grown crystal was a single phase of langasite-type structure and lattice parameters, a- and c-axes lengths, were decreased by the Al substitution. The back-reflection Laue image revealed that the grown crystal was single crystal and crystalline facets derived from (0 0 1) plane. Actual chemical composition of grown crystal was little different from the nominal composition with stoichiometric composition.
Keywords :
X-ray diffraction; calcium compounds; crystal growth from melt; lattice constants; piezoelectric materials; tantalum compounds; transparency; Al substitution; Ca3Ta(Ga0.5Al0.5)3Si2O14; Czochralski method; back- reflection Laue image; chemical composition; langasite-type structure; lattice parameters; piezoelectric single crystal; powder X-ray diffraction; single crystal; transparency; yellow color; Chemicals; Crystals; Lattices; Powders; Temperature; Temperature sensors; X-ray scattering; Crystal Growth; Langasite; Piezoelectric Material; Single Crystal;
Conference_Titel :
Applications of Ferroelectrics, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy (ISAF/IWATMD/PFM), 2014 Joint IEEE International Symposium on the
Conference_Location :
State College, PA
DOI :
10.1109/ISAF.2014.6922990
