Title :
CMOS T/R Switch Design: Towards Ultra-Wideband and Higher Frequency
Author :
Li, Qiang ; Zhang, Y.P.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fDate :
3/1/2007 12:00:00 AM
Abstract :
This paper presents the comprehensive considerations of CMOS transmit/receive (T/R) switch design towards ultra-wideband and over 15-GHz frequencies. Techniques for minimizing parasitics and increasing linearity are discussed. A customized transistor layout is proposed for T/R switch design and its effects on insertion loss and isolation are studied. The analysis shows that a series-only architecture using the customized transistor layout achieves better insertion loss and reasonable isolation. A double-well body-floating technique is proposed and its effects are discussed. A differential switch architecture without shunt arms is designed and verified by experimental results. Fabricated in 0.13-mum triple-well CMOS, the T/R switch exhibits less than 2 dB insertion loss and higher than 21 dB isolation up to 20 GHz. With resistive body floating and differential architecture, the high linearity is of ultra-wideband characteristic, more than 30-dBm power 1-dB compression point (P1dB) is obtained up to 20 GHz in only 0.03 mm2 active die area.
Keywords :
CMOS integrated circuits; radio receivers; radio transmitters; switches; ultra wideband communication; CMOS integrated circuits; CMOS switch; CMOS transmit/receive switch; MOSFET switches; RF switches; differential switch; double-well body-floating technique; linearity increase; parasitic minimization; transistor layout; triple-well CMOS; ultra wideband frequency; CMOS technology; Degradation; Insertion loss; Linearity; MOSFETs; Radio frequency; Radiofrequency integrated circuits; Switches; Switching circuits; Ultra wideband technology; CMOS integrated circuits; MOSFET switches; RF switches; cutoff; differential; floating body; transmit/receive (T/R) switches; triple-well; ultra-wideband (UWB);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2006.891442