Title :
Application of Kohonen and supervised forced organisation maps to fault diagnosis in CMOS opamps
Author :
Collins, P. ; Yu, Son-Cheol ; Jervis, B.W. ; Bell, I.M. ; Taylor, G.
Author_Institution :
Sch. of Eng. Inf. Technol., Sheffield Hallam Univ.
fDate :
10/27/1994 12:00:00 AM
Abstract :
Transistors with gate oxide shorts have been identified to 100% fault coverage in a CMOS opamp by monitoring supply current changes first using multilayer perceptrons and then Kohonen maps to resolve any ambiguities. A supervised forced organisation map allows the location and resistance of the short to be determined
Keywords :
CMOS integrated circuits; fault location; feedforward neural nets; integrated circuit testing; linear integrated circuits; operational amplifiers; self-organising feature maps; short-circuit currents; CMOS opamps; Kohonen maps; fault diagnosis; gate oxide shorts; multilayer perceptrons; supervised forced organisation maps; supply current; transistors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19941281
