DocumentCode :
1192133
Title :
Analog network testability measurement: a symbolic formulation approach
Author :
Carmassi, Roberto ; Catelani, Marcantonio ; Iuculano, Gaetano ; Liberatore, Antonino ; Manetti, Stefano ; Marini, Mauro
Author_Institution :
SMA SpA, Florence, Italy
Volume :
40
Issue :
6
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Firstpage :
930
Lastpage :
935
Abstract :
A symbolic formulation approach is applied to the problem of computing testability features of analog linear networks. The program, SAPTES, obtained by following this approach is presented. The program can be a very useful tool for designers and researchers in the field of linear analog circuits. SAPTES, which is written in LISP and runs on MS-DOS personal computers, is able to compute the testability of linear circuits of rather high complexity (composed of tens of components and nodes). Computational times range from a few tens of seconds to some tens of minutes on medium speed computers. The program is easily transportable to workstations or a mainframe, and, for the mainframe, program performance will considerably increase
Keywords :
analogue circuits; circuit CAD; circuit analysis computing; linear network analysis; microcomputer applications; CAD; LISP; MS-DOS personal computers; SAPTES; analog linear networks; fault analysis; symbolic analysis; symbolic formulation; testability measurement; transportable program; Circuit faults; Circuit testing; Equations; Fault diagnosis; Helium; Jacobian matrices; Life testing; System testing; Transfer functions; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.119770
Filename :
119770
Link To Document :
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