DocumentCode
1192140
Title
FeHfN and FeHfNO soft magnetic films for RF applications
Author
Couderc, S. ; Viala, B. ; Ancey, P. ; Bouche, G. ; Pantel, R.
Author_Institution
STMicroelectromcs Adv. R&D Crolles, France
Volume
41
Issue
10
fYear
2005
Firstpage
3319
Lastpage
3321
Abstract
Downsizing RF spiral inductors is thought possible with using ferromagnetic material such as high magnetization FeHfN . However, increasing the natural resistivity of FeHfN would be suitable for a better confinement with cancelling the series capacitance with the inductor. Indeed, the magnetic material can be almost in contact to the metal traces, therefore increasing confinement. In this paper, we first detail optimization of FeHfN films combining microstructural investigations and magnetic characterizations. Then, we reveal the effect O incorporation in FeHfN films. Both processes: nitrogenation and oxydation are rather antagonists but combine advantageously. FeHfNO film consists in nanoscale grains scattered in an oxidized matrix. However, it is still difficult to retain saturation magnetization 4πMs above 10 kG with resistivity higher than 103μΩ cm. Finally, the dual reactive process is promising but requires further investigations.
Keywords
ferromagnetic materials; iron compounds; magnetic thin films; nitridation; oxidation; soft magnetic materials; sputtered coatings; thin film inductors; FeHfN; FeHfNO; RF applications; ferromagnetic material; magnetic characterization; microstructural investigation; nitrogenation; oxidation; resistivity; series capacitance; soft magnetic films; spiral inductors; Capacitance; Conductivity; Inductors; Magnetic confinement; Magnetic films; Magnetic materials; Radio frequency; Saturation magnetization; Soft magnetic materials; Spirals; Fe–X–(N)–O films; microstructure investigations; resistivity; soft magnetic materials;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2005.854906
Filename
1519292
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