• DocumentCode
    1192140
  • Title

    FeHfN and FeHfNO soft magnetic films for RF applications

  • Author

    Couderc, S. ; Viala, B. ; Ancey, P. ; Bouche, G. ; Pantel, R.

  • Author_Institution
    STMicroelectromcs Adv. R&D Crolles, France
  • Volume
    41
  • Issue
    10
  • fYear
    2005
  • Firstpage
    3319
  • Lastpage
    3321
  • Abstract
    Downsizing RF spiral inductors is thought possible with using ferromagnetic material such as high magnetization FeHfN . However, increasing the natural resistivity of FeHfN would be suitable for a better confinement with cancelling the series capacitance with the inductor. Indeed, the magnetic material can be almost in contact to the metal traces, therefore increasing confinement. In this paper, we first detail optimization of FeHfN films combining microstructural investigations and magnetic characterizations. Then, we reveal the effect O incorporation in FeHfN films. Both processes: nitrogenation and oxydation are rather antagonists but combine advantageously. FeHfNO film consists in nanoscale grains scattered in an oxidized matrix. However, it is still difficult to retain saturation magnetization 4πMs above 10 kG with resistivity higher than 103μΩ cm. Finally, the dual reactive process is promising but requires further investigations.
  • Keywords
    ferromagnetic materials; iron compounds; magnetic thin films; nitridation; oxidation; soft magnetic materials; sputtered coatings; thin film inductors; FeHfN; FeHfNO; RF applications; ferromagnetic material; magnetic characterization; microstructural investigation; nitrogenation; oxidation; resistivity; series capacitance; soft magnetic films; spiral inductors; Capacitance; Conductivity; Inductors; Magnetic confinement; Magnetic films; Magnetic materials; Radio frequency; Saturation magnetization; Soft magnetic materials; Spirals; Fe–X–(N)–O films; microstructure investigations; resistivity; soft magnetic materials;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2005.854906
  • Filename
    1519292