Title :
Fabrication of highly [001] oriented L10 FePt thin film using NiTa seed layer
Author_Institution :
Corporate R&D Center, Toshiba Corp., Kawasaki, Japan
Abstract :
A highly [001] oriented L10 FePt thin film has been successfully fabricated on glass disk substrates by using Ni-Ta alloy seed layer with O2 exposure process. The [001] orientation of Fe-Pt was improved by exposing Ni-Ta surface to O2 ambient in the deposition process of Ni-Ta/Cr/Pt/Fe-Pt film. An excess O2 exposure degrades the coercivity because of the suppression of the ordering of FePt. Under the optimum O2 exposure condition, perpendicular coercivity of as large as 6.9 kOe was achieved with good squareness and little remanence in the in-plane magnetization curve for the film stack of Ni-Ta (5 nm)/Cr (5 nm)/Pt (10 nm)/Fe-Pt (10 nm)/C (7 nm) structure. The total thickness of the underlayers is as thin as 20 nm.
Keywords :
coercive force; ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic thin films; metallic thin films; nickel alloys; platinum alloys; remanence; sputtered coatings; substrates; tantalum alloys; 20 nm; NiTa seed layer; NiTa-Cr-Pt-FePt; coercivity; glass disk substrates; highly oriented thin film; magnetization curve; remanence; Chromium; Coercive force; Fabrication; Glass; Infrared heating; Magnetic films; Magnetic materials; Perpendicular magnetic recording; Substrates; Transistors; (001) orientation; FePt; Ni–Ta; O; high anisotropy material; order parameter; perpendicular magnetic recording media; seed layer;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.855203