• DocumentCode
    1192512
  • Title

    Analysis of shielded microstrip lines with arbitrary metallization cross section using a vector finite element method

  • Author

    Alam, Md Shah ; Hirayama, Koichi ; Hayashi, Yoshio ; Koshiba, Masanori

  • Author_Institution
    Dept. of Electron. Eng., Hokkaido Univ., Sapporo, Japan
  • Volume
    42
  • Issue
    11
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    2112
  • Lastpage
    2117
  • Abstract
    The finite element method (FEM) with the high-order mixed-interpolation-type triangular element is used to solve the problem of practical microstrip lines with arbitrary metallization cross section. Analyses are carried out to produce the frequency characteristics of propagation constant, characteristic impedance, and attenuation constant of shielded microstrip lines with rectangular, trapezoidal, and semi-trapezoidal strip cross sections. A comparison of the numerical results with those of the existing results shows good agreement and thus verifies the versatility of the FEM. Also, the numerical results show the effects of the metallization cross sections on the transmission properties and thus emphasize the importance of considering the practical microstrip configurations in the design of miniaturized MMICs
  • Keywords
    MMIC; finite element analysis; interpolation; metallisation; microstrip lines; waveguide theory; attenuation constant; characteristic impedance; finite element method; frequency characteristics; high-order mixed-interpolation-type triangular element; metallization cross section; miniaturized MMICs; propagation constant; rectangular strip cross sections; semitrapezoidal strip cross sections; shielded microstrip lines; transmission properties; trapezoidal strip cross sections; vector FEM; Attenuation; Fabrication; Finite element methods; Frequency; Geometry; Impedance; Metallization; Microstrip; Propagation constant; Strips;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.330127
  • Filename
    330127