DocumentCode :
1192540
Title :
Measurement of High Q at High Frequencies
Author :
Ryan, Reginald D. ; Eberhardt, John E.
Volume :
18
Issue :
2
fYear :
1969
fDate :
6/1/1969 12:00:00 AM
Firstpage :
129
Lastpage :
132
Abstract :
A high Q tuned circuit is shock excited by the pulsed interruption of current flow through a pair of charge-storage diodes. The resulting damped oscillation is recorded via an FET source follower on a CRO or X-Y recorder. The Q is calculated from the observed logarithmic decay period. A Q of over 900 is readily measured at 60 MHz. The method is useful in the measurement of varactor series resistance and in the checking of the loading imposed by other components. The accuracy of the method is also discussed.
Keywords :
Diodes; Electrical resistance measurement; FETs; Frequency measurement; Pulse circuits; Q factor; Q measurement; RLC circuits; Relays; Switches;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1969.4313781
Filename :
4313781
Link To Document :
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