DocumentCode :
1192591
Title :
Prototype of Phase-Change Channel Transistor for Both Nonvolatile Memory and Current Control
Author :
Hosaka, Sumio ; Miyauchi, Kunihiro ; Tamura, Takuro ; Yin, You ; Sone, Hayato
Author_Institution :
Dept. of Electron. Eng., Gunma Univ., Kiryu
Volume :
54
Issue :
3
fYear :
2007
fDate :
3/1/2007 12:00:00 AM
Firstpage :
517
Lastpage :
523
Abstract :
We prototyped phase-change (PC) channel transistors and demonstrated two functions of nonvolatile memory and channel current control. We have developed prototype transistors that use a PC channel instead of a silicon channel. The PC material of a Ge2Sb2Te5 thin film with a thickness of 50 nm was used. We demonstrated a memory function whereby we achieved a reversible change between the crystalline and amorphous phases by applying a source-drain (SD) voltage for Joule heating. In the experiment, the applied voltages for PC between amorphous and crystalline phases were from 5 to 8 V. Control of the channel current was realized by applying a gate bias. The SD current was suppressed to less than 1/20 of that at a gate bias of -3 V by applying a gate bias of 0-3 V
Keywords :
annealing; random-access storage; transistors; Ge2Sb2Te5; PC; annealing; channel current control; channel transistor; melting; nonvolatile memory; one transistor cell; phase change; prototype; Amorphous materials; Crystalline materials; Crystallization; Current control; Nonvolatile memory; Phase change materials; Prototypes; Silicon; Tellurium; Transistors; Annealing; GeSbTe; channel current control; melting; nonvolatile memory; one-transistor cell; phase change (PC);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2006.890386
Filename :
4114844
Link To Document :
بازگشت