DocumentCode :
1192677
Title :
Interferometer for the Measurement of the Fresnel Dragging Effect on Microwaves by a Drifting Electron Plasma
Author :
Gehre, O. ; Mayer, H.M. ; Tutter, M.
Volume :
18
Issue :
3
fYear :
1969
Firstpage :
194
Lastpage :
197
Abstract :
An apparatus is described that measures deviations from reciprocity in the propagation of electromagnetic waves traveling through a medium. The medium under test was plasma. The apparatus was built for 3-cm waves. The minimum detectable phase difference between the two directions was ~ 2 X 10-3 degree.
Keywords :
Electromagnetic measurements; Electromagnetic propagation; Electromagnetic scattering; Electrons; Microwave measurements; Microwave propagation; Phase detection; Plasma measurements; Plasma waves; Testing;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1969.4313799
Filename :
4313799
Link To Document :
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