DocumentCode :
1192987
Title :
Accuracy considerations in self- calibrating A/D converters
Author :
Lee, Hae-Seung ; Hodges, David A.
Volume :
32
Issue :
6
fYear :
1985
fDate :
6/1/1985 12:00:00 AM
Firstpage :
590
Lastpage :
597
Abstract :
Self-calibration techniques can remove linearity errors of weighted-capacitor data converters caused by element matching errors. However, various additional factors can affect the accuracy of a selfcalibrating A/D converter. These include charge injection from certain transistor switches, error in the capacitor in the correction path, voltage coefficient of precision-ratioed capacitors, and noise. The effects of each of these factors on a self-calibrating A/D converter are analyzed. Correction techniques for each factor are presented.
Keywords :
A/D converters; ADC; Analog-to-digital conversion (ADC); Solid-state circuits; CMOS technology; Calibration; Capacitors; Circuits; Helium; Linearity; Phased arrays; Registers; Switches; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1985.1085761
Filename :
1085761
Link To Document :
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