Title :
Accuracy considerations in self- calibrating A/D converters
Author :
Lee, Hae-Seung ; Hodges, David A.
fDate :
6/1/1985 12:00:00 AM
Abstract :
Self-calibration techniques can remove linearity errors of weighted-capacitor data converters caused by element matching errors. However, various additional factors can affect the accuracy of a selfcalibrating A/D converter. These include charge injection from certain transistor switches, error in the capacitor in the correction path, voltage coefficient of precision-ratioed capacitors, and noise. The effects of each of these factors on a self-calibrating A/D converter are analyzed. Correction techniques for each factor are presented.
Keywords :
A/D converters; ADC; Analog-to-digital conversion (ADC); Solid-state circuits; CMOS technology; Calibration; Capacitors; Circuits; Helium; Linearity; Phased arrays; Registers; Switches; Voltage;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1985.1085761