Title :
Photolithographic processing of hybrid glasses for microoptics
Author :
Kärkkäinen, Ari H O ; Rantala, Juha T. ; Tamkin, John M. ; Descour, Michael R.
Author_Institution :
VTT Electron., Oulu, Finland
fDate :
3/1/2003 12:00:00 AM
Abstract :
Hybrid glass materials are used in the photolithographic fabrication of optical and optomechanical structures. Two different photolithographic hybrid glass processing methods are described. The first one is referred as photolithographic patterning and the second as direct photolithographic deforming of hybrid glass materials. No etch transfer of the photoimaged structures is needed. In the latter method even the chemical development step can be excluded from the fabrication. Fabrication of lens-arrays, gratings and other binary structures is presented. The synthesized hybrid glass materials feature minimum optical transmission of 97% at wavelengths ranging from 450 nm to 1600 nm and refractive index of, e.g., 1.53 at 632.8 nm. The photolithographic patterning resulted in structure heights in excess of 180 μm with rms surface roughness values ranging from 10 to 45 nm. The direct photolithographic deforming resulted in structure heights in excess of 27 μm with rms surface roughness values ranging from 1 and 15 nm.
Keywords :
diffraction gratings; micro-optics; microlenses; optical arrays; optical fabrication; optical glass; photolithography; refractive index; surface topography; 180 micron; 450 to 1600 nm; binary structures; direct photolithographic deforming; gratings; hybrid glasses; lens-arrays; microoptics; minimum optical transmission; optical structures; optomechanical structures; photoimaged structures; photolithographic fabrication; photolithographic patterning; photolithographic processing; refractive index; rms surface roughness; structure heights; Etching; Glass; Microoptics; Optical device fabrication; Optical materials; Optical refraction; Optical surface waves; Optical variables control; Rough surfaces; Surface roughness;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2003.809581