• DocumentCode
    1193196
  • Title

    Effect of a ferroelectric inversion layer on the temperature characteristics of SH-Type surface acoustic waves on 36/spl deg/ Y-X LiTaO/sub 3/ substrates

  • Author

    Nakamura, Kiyoshi ; Tourlog, Ailie

  • Author_Institution
    Dept. of Electr. Commun., Tohoku Univ., Sendai, Japan
  • Volume
    41
  • Issue
    6
  • fYear
    1994
  • Firstpage
    872
  • Lastpage
    875
  • Abstract
    The temperature coefficient of delay of the SH-type surface acoustic wave on 36/spl deg/ Y-X LiTaO/sub 3/ substrates with a ferroelectric inversion layer is theoretically analyzed and it is shown that the temperature characteristics can be improved by an electric-field short-circuiting effect of the domain boundary. The experimental results of the temperature coefficient of delay agree well with the theoretical. The minimum value of measured temperature coefficients of delay is 12.6 ppm//spl deg/C for the metallized surface case, which is about one-third of that in a 36/spl deg/ Y-X substrate with no inversion layer. Experimental results on the phase velocity and the electromechanical coupling factor of the SH-type surface acoustic wave are also presented and compared with the theoretical.<>
  • Keywords
    ferroelectric Curie temperature; ion exchange; lithium compounds; surface acoustic wave devices; surface acoustic waves; 36/spl deg/ Y-X LiTaO/sub 3/ substrates; LiTaO/sub 3/; SH-Type surface acoustic waves; domain boundary; electric-field short-circuiting effect; electromechanical coupling factor; ferroelectric inversion layer; leaky SAW devices; metallized surface; phase velocity; proton exchange; shear horizontal waves; temperature characteristics; Acoustic waves; Circuits; Delay effects; Ferroelectric materials; Metallization; Propagation delay; Substrates; Surface acoustic wave devices; Surface acoustic waves; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.330268
  • Filename
    330268