Title :
AC biased sub-nano-tesla magnetic field sensor for low-frequency applications utilizing magnetoimpedance in multilayer films
Author :
Delooze, Paul ; Panina, Larissa V. ; Mapps, Desmond J.
Author_Institution :
Dept. of Commun. & Electron. Eng., Univ. of Plymouth, UK
Abstract :
A sensitive magnetic sensor based on the measurement of reflected incident power from magnetoimpedance (MI) multilayer-film element incorporated into 50 Ω matching network has been produced. The film system was fabricated by radio-frequency sputtering having two outer magnetic layers (NiFe), insulation layers (AlO3), and inner conductor Au. For optimized layer parameters, an MI ratio of 135%, sensitivity 15%/Oe, and linearity within -2.5 and 5 Oe was obtained at a frequency of 434 MHz. An ac sense magnetic field applied to the MI element results in a small amplitude modulation signal due to the impedance variation, which can be measured on the carrier signal. For the sense field frequency of 1 kHz, the resolution of 3.73×10-7 Oe was achieved. To improve the field resolution at lower frequencies (<100 Hz), the use of an ac bias technique has been proposed. For a sense field of 20 and 10 Hz with 5 kHz ac bias, field resolutions of 4.78×10-6 Oe and 5.27×10-6 Oe, respectively, have been obtained.
Keywords :
aluminium compounds; giant magnetoresistance; gold; iron alloys; magnetic field measurement; magnetic multilayers; magnetic sensors; magnetoresistive devices; nickel alloys; sputtering; 50 ohm; AC biased sub-nano-tesla magnetic field sensor; AlO3; Au; NiFe; giant magnetoresistance; low-frequency applications; magnetic multilayer films; magnetoimpedance; radio-frequency sputtering; transverse anisotropy; Conductive films; Magnetic field measurement; Magnetic films; Magnetic multilayers; Magnetic sensors; Optical films; Power measurement; Radio frequency; Signal resolution; Sputtering; AC bias; magnetoimpedance; multilayer; transverse anisotropy;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.854711