DocumentCode
1193247
Title
A New Method of Measuring Dielectric Property of Very-High-Loss Materials at High Frequencies
Author
Ichijo, Bunjiro ; Arai, Tomokazu
Volume
19
Issue
1
fYear
1970
Firstpage
73
Lastpage
77
Abstract
This paper presents a circuit system functioning as a capacitance meter suitable for very-high-loss material with a wide range of application in various fields of scientific research and industrial operation. The minimum equivalent parallel resistance of the specimen to be measured reaches as low as 50 ohms and the measuring range of capacitance is from about 0.1 ~ 1000 pF at 2 MHz. Some experimental data are given for the appreciation of its characteristics.
Keywords
Capacitance measurement; Capacitors; Chemical analysis; Detectors; Dielectric materials; Dielectric measurements; Electrical resistance measurement; Frequency measurement; Inductance; RLC circuits;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1970.4313861
Filename
4313861
Link To Document