• DocumentCode
    1193371
  • Title

    Crosstalk-Aware Channel Coding Schemes for Energy Efficient and Reliable NOC Interconnects

  • Author

    Ganguly, Amlan ; Pande, Partha Pratim ; Belzer, Benjamin

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
  • Volume
    17
  • Issue
    11
  • fYear
    2009
  • Firstpage
    1626
  • Lastpage
    1639
  • Abstract
    Network-on-chip (NOC) is emerging as a revolutionary methodology to integrate numerous intellectual property blocks in a single die. It is the packet switching-based communications backbone that interconnects the components on multicore system-on-chip (SoC). A major challenge that NOC design is expected to face is related to the intrinsic unreliability of the interconnect infrastructure under technology limitations. By incorporating error control coding schemes along the interconnects, NOC architectures are able to provide correct functionality in the presence of different sources of transient noise and yet have lower overall energy dissipation. In this paper, designs of novel joint crosstalk avoidance and triple-error-correction/quadruple-error-detection codes are proposed, and their performance is evaluated in different NOC fabrics. It is demonstrated that the proposed codes outperform other existing coding schemes in making NOC fabrics reliable and energy efficient, with lower latency.
  • Keywords
    error correction codes; error detection codes; industrial property; integrated circuit interconnections; integrated circuit noise; integrated circuit reliability; network-on-chip; crosstalk-aware channel coding schemes; energy dissipation; error control coding schemes; intellectual property; interconnect infrastructure; multicore system-on-chip; network-on-chip; packet switching-based communications; quadruple-error-detection code; reliable NOC interconnects; transient noise; triple-error-correction code; Crosstalk avoidance; error correction coding (ECC); multiple error correction; network on chip (NOC); reliability;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2008.2005722
  • Filename
    4801555