Buried ion-exchanged glass waveguides using field-assisted annealing

Author

Liu, K. ; Pun, E.Y.B.

Author_Institution

Dept. of Electron. Eng., City Univ. of Hong Kong, China

Volume

17

Issue

1

fYear

2005

Firstpage

76

Lastpage

78

Abstract

Theoretical and experimental studies on buried ion-exchanged waveguides using field-assisted annealing (FAA) in erbium-doped phosphate glasses are reported. The procedure for making buried waveguides with the use of a two-step process is demonstrated. An analytical model for the FAA process was developed to simulate the experimental conditions, and both the refractive index profiles and the effective buried depths of these waveguides are predicted. The mode intensity profiles as well as the buried depths are measured, and the measured data are in good agreement with the simulated results.

Keywords

annealing; erbium; integrated optics; ion exchange; optical fabrication; optical glass; optical waveguides; phosphate glasses; refractive index; P₂O₅:Er; buried waveguides; erbium-doped phosphate glasses; field-assisted annealing; glass waveguides; integrated optical components; ion-exchanged waveguides; mode intensity profiles; refractive index profiles; two-step process; Analytical models; Annealing; FAA; Glass; Optical scattering; Optical surface waves; Optical waveguides; Refractive index; Silver; Substrates; Field-assisted annealing (FAA); integrated optics; ion exchange; optical waveguides;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2004.838129

Filename

1372588