DocumentCode :
1193507
Title :
Condensation and Growth of Kirkendall Voids in Intermetallic Compounds
Author :
Weinberg, Kerstin ; Böhme, Thomas
Author_Institution :
Lehrstuhl fur Festkorpermechanik, Univ. Siegen, Siegen, Germany
Volume :
32
Issue :
3
fYear :
2009
Firstpage :
684
Lastpage :
692
Abstract :
A model for the simulation of Kirkendall voiding in metallic materials is presented based on vacancy diffusion, elastic-plastic and rate-dependent deformation of the material. Starting with a phenomenological explanation of the Kirkendall effect we briefly discuss the consequences on the reliability of microelectronic components. Then, a constitutive model for void nucleation and growth is introduced, which can be used to predict the temporal development of voids in solder joints during thermal cycling. We present numerical studies and discuss the potential of the results for the failure analysis of joining connections.
Keywords :
Young´s modulus; chemical interdiffusion; condensation; copper alloys; crystal growth; elastic deformation; joining processes; nucleation; plastic deformation; reliability; solders; tin alloys; vacancies (crystal); voids (solid); Cu3Sn; Kirkendall voids; Young´s modulus; condensation; elastic-plastic deformation; intermetallic compounds; joining connections; microelectronic components; nucleation; phenomenological explanation; rate-dependent deformation; reliability; thermal cycling; vacancy diffusion; Intermetallic compounds; Kirkendall effect; plastic deformation; vacancy diffusion; void distribution; void growth; void nucleation;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2008.2010057
Filename :
4801568
Link To Document :
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