DocumentCode :
1193562
Title :
High-performance AlGaAs/GaAs SDHTs and ring oscillators grown by MBE on Si substrates
Author :
Ren, F. ; Chand, Naresh ; Chen, Young-Kai ; Pearton, S. ; Tennant, D.M. ; Resnick, D.J.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
Volume :
10
Issue :
12
fYear :
1989
Firstpage :
559
Lastpage :
561
Abstract :
High-performance AlGaAs/GaAs selectively doped heterojunction transistors (SDHTs) and 19-stage oscillators fabricated on silicon substrates are discussed. Epitaxial layers of AlGaAs/GaAs were grown by MBE on Si substrates. The mobility of two-dimensional electron gas (2DEG) in the SDHTs was as high as 53000 cm/sup 2//V-s at 77 K for a sheet charge density of 10*1/sup 12/ cm/sup -2/. For 1- mu m-gate-length devices, maximum transconductances of 220 and 364 mS/mm were measured at 300 and 77 K, respectively, for the SDHTs. A minimum propagation delay time of 27 ps/stage at room temperature was obtained for a 19-stage direct-coupled FET logic ring oscillator with a power dissipation of 1.1 mW/stage. The propagation delay time was reduced to 17.6 ps/stage at 77 K. From microwave S-parameter measurements at 300 K, current gain and power gain cutoff frequencies of 15 and 22 GHz, respectively, were measured. These results are comparable to those obtained for SDHT technology on GaAs substrates.<>
Keywords :
III-V semiconductors; aluminium compounds; digital integrated circuits; field effect integrated circuits; gallium arsenide; high electron mobility transistors; molecular beam epitaxial growth; oscillators; semiconductor epitaxial layers; semiconductor growth; silicon; solid-state microwave devices; substrates; 1 micron; 15 GHz; 22 GHz; 28 to 17.6 ps; 2DEG; 300 K; 77 K; AlGaAs-GaAs; DCFL; MBE; SDHTs; Si substrates; current gain; current gain cutoff frequencies; direct-coupled FET logic; electron mobility; microwave S-parameter measurements; power dissipation; power gain cutoff frequencies; propagation delay time; ring oscillators; room temperature; selectively doped heterojunction transistors; semiconductors; sheet charge density; transconductances; two-dimensional electron gas; Current measurement; Frequency measurement; Gallium arsenide; HEMTs; MODFETs; Microwave measurements; Power measurement; Propagation delay; Ring oscillators; Substrates;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.43139
Filename :
43139
Link To Document :
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