Abstract :
The test set described here is capable of measuring the spectral density of phase noise on carrier frequencies from 1 to 500 MHz, for offset frequencies from 20 Hz to 50 kHz. Measurements to 50 MHz are described. The test set has a residual single-sideband phase-noise-power-to-signal-power ratio of -142 dB/Hz at 20 Hz offset from the carrier, which decreases to a floor of -172 dB/Hz at offset frequencies greater than 5 kHz. The estimated calibration accuracy achievable is ±0.8 dB, exclusive of random reading errors due to the Gaussian distribution of the phase fluctuations being observed. The estimated 1 ¿ repeatability of a measurement is 0.7 dB (70 percent of the observations on a given test will fall within ±0.7 dB of the average value). This test set is capable of characterizing the phase-noise performance of existing atomic frequency standards, crystal oscillators, frequency synthesizers, and other high-quality sources more accurately than has previously been possible. The increased accuracy has been achieved by a system design that minimizes readout fluctuations, allows for the accurate measurement of correction factors used to reduce systematic errors, and minimizes the possibility of operator error and bias.
