Title :
Tissue stiffness imaging method using temporal variation of ultrasound speckle pattern
Author :
Jeong, Mok-Kun ; Kwon, Sung-Jae
Author_Institution :
Dept. of Electron. & Commun. Eng., Daejin Univ., Kyeonggi, South Korea
fDate :
4/1/2003 12:00:00 AM
Abstract :
Applying vibration to a medium makes it vibrate. The resulting change in scatterer distribution inside the medium due to applied vibration changes the speckle pattern of ultrasound images. In this case, scatterers in a hard medium experience small displacements, and those in a soft medium experience large displacements. As a result, the amount of speckle pattern brightness change in ultrasound images is related to the tissue stiffness. Using this dependency, a two-dimensional profile of relative tissue stiffness can be constructed qualitatively at the display pixel resolution by determining at each pixel the standard deviation and/or the difference between minimum and maximum values over a certain number of consecutive B-mode images. Experiments with phantoms show that the softer the tissue, the larger the standard deviation. The proposed imaging modality is a simple yet practical method of resolving hard cysts surrounded by soft background in a phantom using B-mode frame data only.
Keywords :
biological tissues; biomedical ultrasonics; brightness; speckle; ultrasonic imaging; 2D profile; B-mode images; US imaging; hard cysts; imaging modality; scatterer distribution; speckle pattern brightness variation; temporal variation; tissue stiffness imaging method; two-dimensional profile; ultrasound images; ultrasound speckle pattern; Acoustic scattering; Brightness; Image resolution; Lesions; Optical scattering; Pixel; Speckle; Strain measurement; Ultrasonic imaging; Vibration measurement; Algorithms; Connective Tissue; Elasticity; Image Enhancement; Motion; Pattern Recognition, Automated; Phantoms, Imaging; Pressure; Scattering, Radiation; Signal Processing, Computer-Assisted; Ultrasonography;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2003.1197969