• DocumentCode
    1193817
  • Title

    Improved perpendicular anisotropy and permanent magnet properties in Co-doped Nd-Fe-B films multilayered with Ta

  • Author

    Uehara, Minoru ; Gennai, Norio ; Fujiwara, Makoto ; Tanaka, Takeo

  • Author_Institution
    R&D Center, Neomax Co. Ltd., Osaka, Japan
  • Volume
    41
  • Issue
    10
  • fYear
    2005
  • Firstpage
    3838
  • Lastpage
    3843
  • Abstract
    Multilayers of 200-nm thick Co-free or Co-doped Nd-Fe-B with 10-nm thick Ta were prepared by sputtering on heated glass substrates and investigated into the microstructure, texture and hard magnet properties. The perpendicularly textured Nd2Fe14B grains evolved in the multilayers with sizes neatly controlled by the thickness of the unit layer. Co was found to dissolve in the Nd2Fe14B grains, resulting in the enhanced c-axis texture possibly due to the modulated surface energy of the Nd2Fe14B phase. It was also found that Co boosts the crystallization and grain growth of the Nd2Fe14B phase, rapidly leading to the relatively stable multilayered structure where the dimension of the Nd2Fe14B grains is exactly defined by the thickness of the unit layer. Such effect of Co suppresses the local variation of the microstructure and minimizes the deterioration of the permanent magnet properties of the multilayer with an increased thickness of 10-μm.
  • Keywords
    crystallisation; grain growth; magnetic multilayers; permanent magnets; perpendicular magnetic anisotropy; 10 nm; 200 nm; Ta; crystallization; grain growth; hard magnet properties; heated glass substrates; microstructure; multilayered structure; permanent magnet properties; perpendicular anisotropy; sputtering; texture; Anisotropic magnetoresistance; Glass; Iron; Magnetic multilayers; Magnetic properties; Microstructure; Neodymium; Permanent magnets; Size control; Sputtering; Permanent magnets; perpendicular magnetic anisotropy; sputtering; thin films;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2005.854868
  • Filename
    1519462