• DocumentCode
    1194007
  • Title

    Unpassivated AlGaN/GaN HEMTs with CW power density of 3.2 W/mm at 25 GHz grown by plasma-assisted MBE

  • Author

    Manfra, M. ; Weimann, N. ; Baeyens, Y. ; Roux, P. ; Tennant, D.M.

  • Author_Institution
    Bell Labs. Lucent Technologies, Murray Hill, NJ, USA
  • Volume
    39
  • Issue
    8
  • fYear
    2003
  • fDate
    4/17/2003 12:00:00 AM
  • Firstpage
    694
  • Lastpage
    695
  • Abstract
    The Ka-band power performance of unpassivated AlGaN/GaN HEMTs grown by plasma-assisted molecular beam epitaxy on 6H-SiC substrates is reported. Transistors with a gate length of 0.2 μm, source-drain spacing of 2 μm, and 100 μm periphery displayed maximum drain currents greater than 1.6 A/mm. Small signal S-parameter measurements yielded an fT of 53 GHz and fMAX of 109 GHz. Passive load pull measurements at 25 GHz of 0.2×100 μm transistors yielded a power density of 3.2 W/mm with 30% PAE and 44% drain efficiency at 1.8 dB gain compression. To the knowledge of the authors, this is the first report of RF output power above 20 GHz from MBE-grown AlGaN/GaN HEMTs.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; microwave field effect transistors; microwave power transistors; molecular beam epitaxial growth; power HEMT; wide band gap semiconductors; 0.2 micron; 100 micron; 109 GHz; 2 micron; 25 GHz; 30 percent; 44 percent; 53 GHz; 6H-SiC substrates; AlGaN-GaN; CW power density; Ka-band power performance; RF output power; S-parameter measurements; SiC; passive load pull measurements; plasma-assisted MBE growth; plasma-assisted molecular beam epitaxy; unpassivated AlGaN/GaN HEMTs;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20030451
  • Filename
    1198009