• DocumentCode
    1194102
  • Title

    Applications of single-wafer rapid-thermal processing to the manufacture of advanced flash memory

  • Author

    Chen, Kuang-Chao ; Shih, Hsueh-Hao ; Hwang, Yaw-Lin ; Hsueh, Cheng-Chen ; Chung, Henry ; Pan, Sam ; Lu, Chih-Yuan

  • Author_Institution
    Si Lab., Macronix Int. Co. Ltd., Hsinchu, Taiwan
  • Volume
    16
  • Issue
    2
  • fYear
    2003
  • fDate
    5/1/2003 12:00:00 AM
  • Firstpage
    128
  • Lastpage
    137
  • Abstract
    The application of single-wafer processing in semiconductor manufacturing has long been touted as the most effective way in reducing cycle time in a production environment as well as shortening the learning cycle for process development. However, one of the bottle neck areas is in the diffusion module in which conventional furnace processes are difficult to replace due to their superior film quality and high throughput. Recently, significant progress has been made in the areas of rapid thermal oxidation (RTO) and low-pressure chemical vapor deposition (LPCVD) such that high quality films of oxide, nitride, and polysilicon were achieved with great improvement in manufacturing cycle time. In this paper, nonvolatile memory devices such as flash EPROM will be used as examples to illustrate the effective applications of RTO and single-wafer LPCVD processes.
  • Keywords
    chemical vapour deposition; flash memories; integrated circuit manufacture; integrated memory circuits; isolation technology; oxidation; rapid thermal processing; RTO; Si; advanced flash memory; chemical vapor deposition processes; diffusion module; flash EPROM; flash memory manufacture; floating gate polysilicon; high quality films; low-pressure LPCVD; nonvolatile memory devices; production environment; rapid thermal oxidation; semiconductor manufacturing; shallow trench isolation; single-wafer LPCVD processes; single-wafer RTP; single-wafer rapid-thermal processing; tunnel oxide; Chemical vapor deposition; Flash memory; Furnaces; Manufacturing processes; Neck; Oxidation; Production; Rapid thermal processing; Semiconductor device manufacture; Throughput;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2003.810942
  • Filename
    1198019