DocumentCode :
1194304
Title :
InGaAs-InP DHBTs for increased digital IC bandwidth having a 391-GHz f/sub /spl tau// and 505-GHz f/sub max/
Author :
Griffith, Z. ; Dahlstrom, M. ; Rodwell, M.J.W. ; Fang, X.-M. ; Lubyshev, D. ; Wu, Y. ; Fastenau, J.M. ; Liu, W.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA, USA
Volume :
26
Issue :
1
fYear :
2005
Firstpage :
11
Lastpage :
13
Abstract :
InP-In/sub 0.53/Ga/sub 0.47/As-InP double heterojunction bipolar transistors (DHBT) have been designed for use in high bandwidth digital and analog circuits, and fabricated using a conventional mesa structure. These devices exhibit a maximum 391-GHz f/sub /spl tau// and 505-GHz f/sub max/, which is the highest f/sub /spl tau// reported for an InP DHBT-as well as the highest simultaneous f/sub /spl tau// and f/sub max/ for any mesa HBT. The devices have been aggressively scaled laterally for reduced base-collector capacitance C/sub cb/. In addition, the base sheet resistance /spl rho//sub s/ along with the base and emitter contact resistivities /spl rho//sub c/ have been lowered. The dc current gain /spl beta/ is /spl ap/36 and V/sub BR,CEO/=5.1 V. The devices reported here employ a 30-nm highly doped InGaAs base, and a 150-nm collector containing an InGaAs-InAlAs superlattice grade at the base-collector junction. From this device design we also report a 142-GHz static frequency divider (a digital figure of merit for a device technology) fabricated on the same wafer. The divider operation is fully static, operating from f/sub clk/=3 to 142.0 GHz while dissipating /spl ap/800 mW of power in the circuit core. The circuit employs single-buffered emitter coupled logic (ECL) and inductive peaking. A microstrip wiring environment is employed for high interconnect density, and to minimize loss and impedance mismatch at frequencies >100 GHz.
Keywords :
III-V semiconductors; bipolar digital integrated circuits; emitter-coupled logic; heterojunction bipolar transistors; indium compounds; semiconductor technology; 142 GHz; 150 nm; 3 to 142 GHz; 30 nm; 391 GHz; 505 GHz; InP-In/sub 0.53/Ga/sub 0.47/As-InP; base sheet resistance; base-collector junction; conventional mesa structure; dc current gain; digital IC bandwidth; double heterojunction bipolar transistors; emitter contact resistivity; high bandwidth analog circuits; high bandwidth digital circuits; highly doped InGaAs base; inductive peaking; interconnect density; microstrip wiring environment; reduced base-collector capacitance; single-buffered emitter coupled logic; static frequency divider; superlattice grade; Analog circuits; Bandwidth; Capacitance; Conductivity; Contact resistance; DH-HEMTs; Digital integrated circuits; Double heterojunction bipolar transistors; Heterojunction bipolar transistors; Indium phosphide; Heterojunction bipolar transistor (HBT);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2004.840715
Filename :
1372680
Link To Document :
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