DocumentCode :
1194570
Title :
Determination of Complex Dielectric Constant of High-Loss Materials
Author :
Rose, G.C. ; Churchill, R.J. ; Cook, K.R.
Volume :
21
Issue :
3
fYear :
1972
Firstpage :
286
Lastpage :
287
Abstract :
A noncontacting measurement system for determining com-plex values of dielectric constant from measured values of complex reflection coefficient is described. A convenient graphical method for relating real and imaginary parts of dielectric constant to measured values and errors in the measured values of reflection coefficient is given.
Keywords :
Crystalline materials; Dielectric constant; Dielectric materials; Dielectric measurements; Equations; Frequency measurement; High-K gate dielectrics; Microwave measurements; Oscillators; Reflection;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1972.4314016
Filename :
4314016
Link To Document :
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