Further Possibilities of the Modulated Subcarrier Technique for Microwave Attenuation Measurements in Industrial Applications

In this paper a microwave system for attenuation measurement by means of the modulated subcarrier method supplying additional information on the actual parameters of the system is described. The information can be used for automatic control of output signal indicator sensitivity making the results independent of the instability of these parameters. Experimental results are reported illustrating the validity of the analysis.