DocumentCode :
1194872
Title :
Automatic Measuring System for a Control of Standard Cells
Author :
Hirayama, Hiroyuki ; Murayama, Yasushi
Volume :
21
Issue :
4
fYear :
1972
Firstpage :
379
Lastpage :
384
Abstract :
The automatic measuring system developed in the Electrotechnical Laboratory to monitor standard cells requiring a lot of measurements is described. It is composed of a scanner, an integrating-type digital voltmeter, a programmer or minicomputer, etc., and carries out the data acquisition and processing for a maximum of 200 cells. The difference in EMF of two cells is measured precisely. To reduce the effect of the induced EMF in the scanner, a delay unit is provided, and procedures minimizing errors and evaluating random errors have been adopted. In the on-line version of system, a great part of the data processing is done during the delay and integrating time of digital voltmeter. Applying this system to the measurement of standard cells, a precision of the order of 0.1 ¿V has been obtained.
Keywords :
Automatic control; Computerized monitoring; Control systems; Delay effects; Laboratories; Measurement standards; Microcomputers; Programming profession; Standards development; Voltmeters;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1972.4314049
Filename :
4314049
Link To Document :
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