DocumentCode :
1194956
Title :
The Design of Broad-Band Resistive Radiation Probes
Author :
Hopfer, Samuel
Volume :
21
Issue :
4
fYear :
1972
Firstpage :
416
Lastpage :
421
Abstract :
Thin-film resistive screens operated in free space above a critical frequency fc are shown to exhibit constant cross sections over extremely broad frequency ranges. Below fc, the cross sections decrease approximately at the rate of 12 dB/octave. Electrical equivalents to the screen in the form of thin-film gratings or grids are used to generate directly an output voltage proportional to the absorbed radiation. Probes with physical cross sections of 1-in diameter and absorptivities of 15-20 percent can be designed to operate from below 200 MHz to well within the millimeter range.
Keywords :
Frequency; Gratings; Instruments; Mesh generation; Microwave measurements; Microwave ovens; Probes; Thin film circuits; Transistors; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1972.4314058
Filename :
4314058
Link To Document :
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