DocumentCode
1194964
Title
Approximations for carrier density in nonparabolic semiconductors
Author
Ariel-Altschul, Viktor ; Finkman, Eliezer ; Bahir, Gad
Author_Institution
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Volume
39
Issue
6
fYear
1992
fDate
6/1/1992 12:00:00 AM
Firstpage
1312
Lastpage
1316
Abstract
The authors propose simple, analytic approximations that describe properties of semiconductors with nonparabolic energy bands. The approach is based on the two-level kp model of the semiconductor statistics which includes effects of band nonparabolicity and carrier degeneracy. The new expressions are in the form of a correction to the classical, Boltzmann approximation of the semiconductor statistics and do not introduce any new adjustable parameters. These relations can be applied to both narrow- and wide-bandgap nonparabolic semiconductors. The authors calculate the low-frequency capacitance of a nonparabolic MIS structure and compare the results with an accurate numerical model and experimental measurements of a HgCdTe capacitor. The solution includes the contributions of both types of carriers and the effect of impurity freezeout. The new approximations should be useful for characterization and modeling of semiconductor devices with nonparabolic energy bands
Keywords
II-VI semiconductors; cadmium compounds; capacitance; carrier density; mercury compounds; metal-insulator-semiconductor structures; Boltzmann approximation; HgCdTe capacitor; carrier density; characterization; correction; impurity freezeout; low-frequency capacitance; modeling of semiconductor devices; narrow bandgap semiconductors; nonparabolic MIS structure; nonparabolic energy bands; nonparabolic semiconductors; numerical model; semiconductor statistics; two-level kp model; wide bandgap semiconductors; Capacitors; Charge carrier density; Conductors; Electrons; Numerical models; Photonic band gap; Poisson equations; Semiconductor impurities; Semiconductor materials; Statistics;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.137309
Filename
137309
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