Title :
Reliability Analysis on Shifted and Random Declustering Block Layouts in Scale-Out Storage Architectures
Author :
Jun Wang ; Ruijun Wang ; Jianglin Yin ; Huijun Zhu ; Yuanyuan Yang
Author_Institution :
EECS Dept., Univ. of Central Florida, Orlando, FL, USA
Abstract :
Reliability is a critical metric in the design and development of scale-out data storage clusters. A general multiway replication-based declustering scheme has been widely used in enterprise large-scale storage systems to improve the I/O parallelism. Unfortunately, given an increasing number of node failures, how often a cluster starts losing data when being scaled-out is not well investigated. In this paper, we studied the reliability of multi-way declustering layouts by developing an extended model, more specifically abstracting the Continuous Time Markov chain to an ordinary differentiate equation group, and analyzing their potential parallel recovery possibilities. Our comprehensive simulation results on Mat lab and SHARPE show that the shifted declustering layout outperforms the random declustering layout in a multi-way replication scale-out architecture, in terms of data loss probability and system reliability by up to 63% and 85% respectively. Our study on both 5-year and 10-year system reliability equipped with various recovery bandwidth settings shows that, the shifted declustering layout surpasses the random declustering layout in both cases by consuming up to 5.2% and 11% less recovery bandwidth.
Keywords :
Markov processes; differential equations; input-output programs; mathematics computing; parallel processing; pattern clustering; software reliability; storage management; I/O parallelism; Matlab; SHARPE; continuous time Markov chain; enterprise large-scale storage systems; multiway replication-based declustering scheme; ordinary differentiate equation; parallel recovery; random declustering block layouts; reliability analysis; scale-out data storage clusters; scale-out storage architectures; shifted declustering block layouts; Analytical models; Bandwidth; Equations; Layout; Mathematical model; Redundancy; Continuous Time Markov Chains (CTMC); Multi-way replication; Reliability; large-scale storage system;
Conference_Titel :
Networking, Architecture, and Storage (NAS), 2014 9th IEEE International Conference on
Conference_Location :
Tianjin
DOI :
10.1109/NAS.2014.32