DocumentCode
11950
Title
Path-Directed Abstraction and Refinement for SAT-Based Design Debugging
Author
Keng, Brian ; Veneris, Andreas
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Volume
32
Issue
10
fYear
2013
fDate
Oct. 2013
Firstpage
1609
Lastpage
1622
Abstract
Functional verification has become one of the most time-consuming tasks in the very large scale integration design flow accounting for up to 57% of the total project time. The largest component of this task is that of design debugging due to its resource-intensive manual nature. With the ever growing size of modern designs and their error traces, the complexity of the debugging problem poses a great challenge to automated debugging techniques. To overcome this challenge, this paper introduces a novel path-directed abstraction and refinement algorithm for design debugging to manage excessive error trace lengths. A sliding window of the error trace is iteratively analyzed in a time-windowing framework, which is made possible by the use of the path-directed abstraction. This abstraction forms a concise approximation of nonmodeled parts of the error trace while simultaneously providing an efficient representation for refinement. The result is an algorithm that dramatically reduces the memory requirements of debugging while mitigating the incomplete results of past techniques. Experimental results on industrial designs with long error traces show that the proposed approach can analyze traces that are 64.6% longer while simultaneously decreasing peak memory usage compared to previous work.
Keywords
VLSI; electronic design automation; error handling; program debugging; program verification; refinement calculus; SAT-based design debugging; automated debugging techniques; error trace lengths; memory requirements; path-directed abstraction; refinement algorithm; time-windowing framework; very large scale integration design flow; Abstracts; Algorithm design and analysis; Approximation algorithms; Approximation methods; Debugging; Integrated circuit modeling; Mathematical model; Abstraction; debugging; diagnosis; refinement; register transfer level (RTL); verification; very large scale integration;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2013.2263036
Filename
6601029
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