Title :
Electrical and optical characteristics of vacuum-sealed polysilicon microlamps
Author :
Mastrangelo, Carlos H. ; Yeh, James Hsi-Jen ; Muller, Richard S.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fDate :
6/1/1992 12:00:00 AM
Abstract :
A silicon-filament vacuum-sealed incandescent light source has been fabricated using IC technology and subsurface micromachining. The incandescent source consists of a heavily doped p+ polysilicon filament coated with silicon nitride and enclosed in a vacuum-sealed (≈80-mT) cavity in the silicon-chip surface. The filament is formed beneath the surface and later released using sacrificial etching to obtain a microstructure that is protected from the external environment. The filament is electrically heated to reach incandescence at a temperature near 1400 K. The power required to achieve this temperature (for a filament 510×5×1 μm) is 5 mW. The emitted optical power is 250 μW, and the peak in the spectrum distribution is near 2.5 μm. The radiation approximately follows Lambert´s cosine law. The subsurface micromachining technique used to produce the evacuated cavity has applications in other micromechanical devices
Keywords :
elemental semiconductors; filament lamps; micromechanical devices; silicon; 1400 K; 2.5 micron; 250 muW; 5 mW; 80 mtorr; IC technology; Si filament; Si3N4-Si; electrical characteristics; filament lamps; incandescent light source; micromechanical devices; optical characteristics; polycrystalline Si; polysilicon filament; sacrificial etching; semiconductors; subsurface micromachining; temperature; vacuum sealed cavity; vacuum-sealed polysilicon microlamps; Etching; Light sources; Micromachining; Micromechanical devices; Microstructure; Protection; Silicon; Stimulated emission; Temperature; Vacuum technology;
Journal_Title :
Electron Devices, IEEE Transactions on