DocumentCode :
1195233
Title :
A 200-A/2000-V MOS-GTO with improved cell design
Author :
Stoisiek, Michael ; Oppermann, Klaus G. ; Stengl, Reinhard
Author_Institution :
Siemens AG, Munich, Germany
Volume :
39
Issue :
6
fYear :
1992
fDate :
6/1/1992 12:00:00 AM
Firstpage :
1521
Lastpage :
1528
Abstract :
A large-area MOS-controlled thyristor (MOS-GTO) has been realized by introducing a new wafer-scale repair technique. The large-area device has a diameter of 3 cm. It has been contacted with an IC-compatible pressure contact and has been fabricated on a lowly doped n-type substrate suitable for very-high-voltage applications comparable to conventional GTOs. The snubbered and unsnubbered turn-off currents were 400 and 200 A, respectively. The currents could be switched up to a final anode-to-cathode voltage of >1500 V. The unique turn-off capabilities have been achieved by an improved design of the MOS-controlled emitter cell. The main feature of the new cell design is an integrated emitter series resistor, which avoids current filamentation during turn-off. In addition an n+ buried layer underneath the source of the MOS-controlled emitter cell has been used to reduce the parasitic action of the MOS part of the emitter cell during the on-state
Keywords :
metal-insulator-semiconductor devices; power electronics; thyristors; 200 A; 2000 V; 400 A; IC-compatible pressure contact; MOS-GTO; MOS-controlled emitter cell; anode-to-cathode voltage; cell design; integrated emitter series resistor; large-area MOS-controlled thyristor; lowly doped n-type substrate; n+ buried layer; snubbered turn-off current; unsnubbered turn-off currents; very-high-voltage applications; wafer-scale repair technique; Anodes; Insulated gate bipolar transistors; Inverters; MOSFETs; P-n junctions; Resistors; Space technology; Thyristors; Turning; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.137335
Filename :
137335
Link To Document :
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