Title : 
HF Characterization and Nonlinear Modeling of a Gapped Toroidal Magnetic Structure
         
        
            Author : 
Dalessandro, Luca ; Odendaal, Willem G Hardus ; Kolar, Johann W.
         
        
            Author_Institution : 
Power Electron. Syst. Lab., Swiss Fed. Inst. of Technol., Zurich
         
        
        
        
        
        
        
            Abstract : 
The frequency dependent characteristics of a gapped toroidal structure are extracted empirically over a bandwidth that exceeds 30MHz. The analysis is complicated due to nonlinear flux distributions, magnetic properties of the core material, leakage inductance, stray capacitances, and eddy currents in the windings. A permeance model of the core is implemented to model the magnetic circuit. The model includes a linear lumped element equivalent circuit to approximate the nonlinear complex permeability of the core, which was measured empirically. Stray capacitance and inductance of the winding are also modeled. A gyrator is used to couple the electric and magnetic models for circuit simulation. The measured and simulated results of open-circuit impedance from the secondary winding and the transimpedance gain (V/A) of the current sensor are compared and discussed
         
        
            Keywords : 
eddy currents; equivalent circuits; gyrators; magnetic circuits; magnetic cores; magnetic leakage; windings; core material; core permeance model; current sensors; eddy currents; gapped toroidal magnetic structure; gyrator; leakage inductance; linear lumped element equivalent circuit; magnetic circuit; magnetic properties; nonlinear complex permeability; nonlinear flux distributions; nonlinear modeling; open-circuit impedance; stray capacitance; Bandwidth; Capacitance; Circuit simulation; Frequency dependence; Hafnium; Inductance; Magnetic cores; Magnetic flux; Magnetic materials; Toroidal magnetic fields; Gapped toroidal structure; nonlinear flux distributions;
         
        
        
            Journal_Title : 
Power Electronics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TPEL.2006.880357