• DocumentCode
    1195339
  • Title

    Parametric identification of two-port models in the frequency domain

  • Author

    Guillaume, Patrick ; Pintelon, Rik ; Schoukens, Johan

  • Author_Institution
    Vrije Univ. Brussel, Belgium
  • Volume
    41
  • Issue
    2
  • fYear
    1992
  • fDate
    4/1/1992 12:00:00 AM
  • Firstpage
    233
  • Lastpage
    239
  • Abstract
    The authors treat the problem of parametric estimation of linear time-invariant dynamic two-port models (e.g. the short-circuit admittance matrix) from experimental data. A multivariate frequency-domain Gaussian maximum likelihood estimator is proposed to estimate the unknown coefficients occurring in the rational two-port model. It takes the perturbing noise of all the measured voltages and currents into account. The covariance matrix of the noise is assumed to be known, e.g. from measurements. The estimates and their covariance matrix are obtained as the result of an optimization procedure. The value of the minimized loss function and the covariance matrix of the estimates can be used to determine the model structure. The ability of the estimator to handle real measurement problems is demonstrated by means of experimental results. Using the estimated two-part parameters of an unloaded band-pass filter, it was possible to predict the transfer function of the loaded filter within an error of ±0.01 dB on the magnitude and ±0.1° on the phase
  • Keywords
    band-pass filters; frequency-domain analysis; multiport networks; optimisation; parameter estimation; random noise; transfer functions; MIMO; calibration; covariance matrix; frequency domain; linear time-invariant dynamic two-port models; loaded filter; minimized loss function; multivariate frequency-domain Gaussian maximum likelihood estimator; optimization; parametric estimation; perturbing noise; short-circuit admittance matrix; two-part parameters; two-port models; unloaded band-pass filter; Admittance; Band pass filters; Covariance matrix; Current measurement; Frequency estimation; Maximum likelihood estimation; Noise measurement; Parameter estimation; Phase estimation; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.137353
  • Filename
    137353